新技術説明会 - PowerPoint プレゼンテーション

新技術説明会

株式会社堀場製作所

【ラマン分光】

必見！ AFM-ラマンによるナノイメージの世界

© 2013 HORIBA Scientific. All rights reserved.

Ultra fast simultaneous AFM and Raman hyper-spectral imaging: chemical and physical investigation of nano-materials made fast and easy.

Emmanuel LeroyAFM-Raman Product Manager


Ultra fast AFM-Raman imaging

256x256pts simultaneous topography and composite Raman image of graphene


Overview

Introduction: Multi-modal imagingWhy AFM-Raman, why Tip Enhanced

Raman? Instrument combination challengesFast and simultaneous AFM and

RamanAdded advantage


Multi-modal imaging

Microscopy today is much more than looking at a magnified image


Multi-modal imaging

Microscopy today is much more than looking at a magnified image

It’s about multiple ways of looking at a given sample.


Overview




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Why AFM-Raman?

Scanning Probe Microscopy (SPM) and specifically Atomic Force Microscopy (AFM) have made nanoscale imaging an affordable realityCheaper than SEM and TEMMuch less sample preparation.Very versatile


SPM: much more than topography

Atomic Force Microscopy (AFM) came as an easier to use and flexible technique…With AFM’s popularity

came many more modes of operation,providing much more than topography



Elasticity / plasticity of materials, Young’s modulus



Conductivity/Resistivity (C-AFM), Surface Potential / Kelvin Probe (SKM,

KPFM)

Graphene on copper foil, AFM and KPFM images



Magnetic Force (MFM)


Why AFM-Raman

AFM, the most common SPM technique, is ideal for imaging physicalparameters, but lacks sensitivity to chemical structure and composition

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Spectroscopy: spectra to images

Spectroscopy, especially IR and Raman, are much better suited for label-freechemical analysis



…but spectra are still pretty obscure for most people



People want things they can make sense of: people want images!


Why AFM-Raman

AFM-Raman brings chemical imaging and nanoscale physical characteristics imaging together.

This is multi-modal imaging pushed beyond optical microscopy and to the nano scale


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Why TERS?

Raman spectroscopy brings highly specific chemical information, but spatial resolution is limited by Abbe’slaw of light diffraction.

SPM techniques can provide many physical properties at the nano scale (mechanical, electrical, magnetic…), but no chemical specificity


Why TERS? Super-resolution techniques

have brought chemical information down to ~30nm scale, but they all rely on fluorescent labels.

Tip-Enhanced Raman brings the prospect of label-free chemicalimaging at the nanoscale.

Deckert et al. 2008

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Overview





Instrumental Challenges

Combining such different techniques as SPM and Spectroscopy is challenging.

The common approach has been to perform co-localized measurements in sequence: First Spectroscopy to find an area of interest, then AFM for nanoscale characterization, or vice-versa: find a physical structure of interest to determine chemical structure with spectroscopy


Challenges: Optics

High Numerical Aperture (NA) optics Tighter spot on the tip = better contrastHigher collection efficiency = better signal

In order to illuminate the probe tip, there needs to be proper optical access for such high numerical aperture objective lens


Challenges: Optics

High Numerical Aperture (NA) optics Tighter spot on the tip = better contrast

The spot size is directlydependent on the NA asR = 0.6*/NA


Challenges: Optics

High Numerical Aperture (NA) opticsHigher collection efficiency = better signal

The collection efficiency depends on the NA2!


Challenges: Optics & Sample

High Numerical Aperture (NA) optics

Best solution: Inverted microscopeSPM on top, bottom

access for High NA objective up to 1.49

Samples need to be transparent

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Challenges: Optics & Sample

For opaque samples: Top illumination can accept

fairly high NA objectives (0.7)Shadowing from the

cantilever is an issueand the probe needs to be protruded


Challenges: AFM diode

It is also important to note that the AFM feedback requires a diode laser, which may interfere with the spectroscopy measurements: An AFM diode in the IR is required to perform

AFM-Raman in the full range of VIS-NIR lasers available.

The diode must not use the same beam path as the spectroscopy laser, or independent alignment becomes very cumbersome


Overview





Fast simultaneous AFM-Raman IR AFM Diode (no interference) Access to change sample and

tip without moving the head Auto-cantilever alignment and

tuning (comes back to the same place)

Top access with 0.7NA objective, side access with up to 0.7NA for TERS

Visual confirmation of alignment in all ports


Fast simultaneous AFM-Raman IR AFM Diode (no interference) Access to change sample and

tip without moving the head Auto-cantilever alignment and

tuning (comes back to the same place)

Top access with 0.7NA objective, side access with up to 0.7NA for TERS

Visual confirmation of alignment in all ports

1300nm

Easy tip exchange

Auto alignment

High NA access

Video viewing of tip and laser


Powerful software package

KnowItAll®HORIBA EditionFast chemical identificationHORIBA spectral database (>1750 spectra)

Integrated multivariate module

High level analysis at a touch of a button

PCA | MCR | HCA |DCA

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Overview





Added advantage

Not only integrates a powerful, highresolution AFM, with high frequencyscanner, little sensitive to vibrationsAlso combines powerful Raman

microscope that can be used as stand-alone (3 instruments in one)


Added advantage: real-time autofocus

Lipid layer: Raman and AFM topography 30x30um scan 7um topography

The AFM also acts as an autofocus in real time, therefore it is possible to measure samples with very high topography without worrying about depth of focus and the sample going in and out of focus… no need for additional pass to measure topography or additional hardware, it is all included! A nice added feature


Conclusions

Tight integration between a SPMsystem designed for spectroscopy anda powerful micro-spectrometer bringsefficient, ultra fast multi-modal imagingto characterize nano materialsHigh spatial resolution and speed is

achieved thanks to open access fromthe top with high NA optics, and lack ofinterference from the AFM.


Conclusions

Suited for TERS with side access portfor best polarization and collectionefficiencyLong term stability insured thanks to

rugged, inovative, automated alignmentfeatures making it easy to use.


Conclusions

Experience the mostversatile, easy-to-use, andfast simultaneous AFM-Raman systemFor more information come

to our booth #

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