Diffractometer

Arranged byDida AnggianaNIM 1414110Rista RistianiNIM 141411026DiffractometerName of Device : Diffractometer

What is in the diffractometer?

Diffractometer Type :X-Ray DiffractometerX-Ray Diffraction (XRD) merupakan teknik analisis non-destruktif untuk mengeidentifikasi dan menentukan secara kuantitatif tentang bentuk berbagai kristal, yang disebut fase. Identifikasi diperoleh dengan membandingkan pola difaksi dengan sinar-X( http://akudanduniakusajatitik.blogspot.com/2012/06/x-ray-diffraction-part-3.html )Electron DiffractometerNeutron DiffractometerFunctionDiffractometer is a measuring instrument for analyzing the stucture of a material from the scattering pattern produce when a beam of radiation or particles ( such as X-rays, electrons or neutrons) interact with it.(http://en.wikipedia.org/wiki/Diffractometer)Diffractometer can be used to determine the phase of the material and the concentration of the materials .Diffractometer can also distinguish between crystalline and amorphous material. Diffractometer also can measure all kinds of randomness , crystal irregularities and characterization of crystalline materials Diffractometer also can identify minerals. http://akudanduniakusajatitik.blogspot.com/2012/06/x-ray-diffraction-part-3.html

How it WorksA beam of X-rays with a wavelength (monochromatic light) falls on the geometrical structure of atoms or molecules of a crystal on the angle . If the path difference between light reflected from successive field is proportional to the n-wavelength, then the rays undergo diffraction. Diffraction events may occur because of the distance of atoms in the crystal and molecular ranged from 0.15 to 0.4 nm, which corresponds to the spectrum of electromagnetic waves in the wavelength range of X-rays with photon energy between 3 to 8 keV. According to Bragg's Law, by varying the angle , it can be obtained the width between the different slit in polycrystalline materials. Then, position angle and peak intensity of the diffraction can be drawn on a graph results and obtained a pattern that show the characteristic of the sample..http://akudanduniakusajatitik.blogspot.com/2012/06/x-ray-diffraction-part-3.htmlsafetymaterial that will be analyzed must have the right size and specimen material should be a material that can be measured with a diffractometerhttp://kimia.ft.uns.ac.id/file/Kuliah/Kimia%20Fisika/Tugas%20I/XRD%20IV.pdfTime minimizing time around a radiaton source will reduce total exposureDistance maximize dstance fram a radiation source to reduce total exposureShielding material used to attenuate radiation and reduce occupational exposure. For x-Ray, shielding is most often lead.http://publicsafety.tufts.edu/ehs/xray-diffraction-basic-safety-presentation/